Compressive Image Scanning Microscope

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Abstract

we present a novel approach to implement compressive sensing in laser scanning microscopes (LSM), specifically in image scanningmicroscopy (ISM), using a single-photon avalanche diode (SPAD) array detector. Our method addresses two significant limitations in applying compressive sensing to LSM: the time to compute the sampling matrix and the quality of reconstructed images. We employ a fixed sampling strategy, skipping alternate rows and columns during data acquisition, which reduces the number of points scanned by a factor of four and eliminates the need to compute different sampling matrices. By exploiting the parallel images generated by the SPAD array, we improve the quality of the reconstructed compressive-ISM images compared to standard compressive confocal LSM images. Our results demonstrate the effectiveness of our approach in producing higher-quality images with reduced data acquisition time and potential benefits in reducing photobleaching.

Citation

@misc{https://doi.org/10.48550/arxiv.2307.09841,
  doi = {10.48550/ARXIV.2307.09841},
  url = {https://arxiv.org/abs/2307.09841},
  author = {Gunalan,  Ajay and Castello,  Marco and Piazza,  Simonluca and Li,  Shunlei and Diaspro,  Alberto and Mattos,  Leonardo S. and Bianchini,  Paolo},
  keywords = {Image and Video Processing (eess.IV),  Computer Vision and Pattern Recognition (cs.CV),  Signal Processing (eess.SP),  Optics (physics.optics),  FOS: Electrical engineering,  electronic engineering,  information engineering,  FOS: Electrical engineering,  electronic engineering,  information engineering,  FOS: Computer and information sciences,  FOS: Computer and information sciences,  FOS: Physical sciences,  FOS: Physical sciences},
  title = {Compressive Image Scanning Microscope},
  publisher = {arXiv},
  year = {2023},
  copyright = {arXiv.org perpetual,  non-exclusive license}
}